NENOVISION
NenoVision is connecting a long tradition of development of scientific instruments with leading innovations within the industry. We are pioneers of in-situ correlative microscopy, developing and producing unique AFM-in-SEM LiteScope™.
LiteScope™ is a unique Atomic Force Microscope (AFM) designed for „plug & play“ integration into the Scanning Electron Microscopes (SEMs). The connection of AFM and SEM merges the strengths of both techniques, resulting in effective workflow and possibilities of complex sample analysis, that was difficult or readily impossible by conventional, separate AFM and SEM instrumentation. LiteScope excels in a variety of modes, such as topography, mechanical, electrical, magnetic, or piezoelectric properties useful in a broad range of fields such as Material science, Nanotechnology, Semiconductors, Life science and other areas of research and industry.